Description:
Scanning Electron Microscopy (SEM) imaging of a cross-sectioned polymer grating structure for assessment of the grating pitch, sidewall profile and structure uniformity & reproducibility (Copyright QinetiQ)

Industry Sectors:
Semiconductor, Photonics/Optoelectronics, Optics, Microelectronics

Techniques:
Scanning Electron Microscopy

Keywords:
diffraction grating, polymer