CEMMNT offer world leading Transmission Electron Microscopy (SEM) services and expertise across multiple industry sectors, offering clients a cost-effective, fast-turn around service whilst utilising state-of-the-art equipment, techniques and facilities.

Transmission Electron Microscopy (TEM) uses a high energy (100-400keV) focused electron beam to generate ultra-high resolution images of thin samples, allowing lattice imaging in the case of crystals. Bulk samples require careful preparation (in plan-view or cross-section) by polishing and/or ion beam thinning to achieve electron transparency. Individual features or devices can be targeted. Free nanoparticles and nanofibres can be analysed directly.  

The technique can be coupled with Energy-Dispersive X-ray analysis (EDX) and Electron Energy Loss Spectroscopy (EELS) providing nanoscale elemental analysis and chemical bonding information. Detailed local crystallographic analysis (phase, orientation, defects and strain) is also possible.

• Image area: 10 nm to 20 microns
• Resolution: 0.2 nm (High-resolution TEM; Lattice imaging)
• Bright-field & dark-field imaging
• Local elemental analysis using EDX and EELS
• Selected area diffraction

• Cross-section analysis
• Multilayer thickness determination
• Defect characterisation
• Interfacial layers (roughness, defects, bonding, ultra-thin layers)
• Local crystal structure determination and visualisation
• Semiconductor device imaging
• Polycrystal grain structure
• Nanoparticle and nanotube size, shape and structure determination

• Inter-disciplinary expertise
• Fast turnaround service
• Access to an unparalleled range of state-of-the-art techniques and facilities 
• Extensive sample preparation experience & capabilities
• Leading expertise in data interpretation
• Wide range of complementary techniques available for comparison
• High quality data
• Confidentiality
• Client-focussed and responsive service
• Discussions with experts with relevant applications experience