CEMMNT offer world leading Optical Profilometry services and expertise, offering clients a cost-effective, fast-turn around service whilst utilising state-of-the-art equipment, techniques and facilities.

Optical profilometry delivers rapid non contact 3-D surface analysis with Angstrom level vertical resolution and lateral resolution down to 0.5 microns. Stroboscopic techniques can be used to characterise devices in motion. The thickness of transparent films can also be measured and interface structures characterised. 

White light is focused on the sample using an interferometric lens which is translated vertically through the point of best focus. The reflected light recombines with a second light path resulting in an interference maxima at best focus which is detected on each pixel of a CCD camera and referenced to the vertical position of the lens.  Software then generates and analyses the 3D profile. Automated stages allow large area images to be obtained whilst maintaining high lateral resolution.

Diamond Turned Aluminium Surface

• Roughness
• Waviness
• Form
• Flatness
• 3D analysis
• Step Height
• Film thickness of transparent films
• Imaging area: up to 7.5 x 7.5 mm (200 x 200 mm with stitching)
• XY Resolution: 0.5 microns (50X objective)
• Z Range: unlimited with stitching
• Z Resolution: 10 pm (0.1 Angstrom)
• Surface reflectivity range: 0.3 - 100% 

Moulded Diffractive Optic

• Medical devices surface finish and wear
• MEMS static and dynamic analysis
• Optics form and roughness
• Wafer roughness
• Cutting tools: sharpness and wear analysis
• Corrosion analysis
• Pole tip recession on hard disks

3D Visualisation Biochip Channels