Techniques
Electron Backscatter Diffraction (EBSD)

Electron Backscatter Diffraction (EBSD) determines crystallographic information from samples in a scanning electron microscope (SEM). Crystallographic texture, preferred orientation, grain structure and micro structure can all be mapped.

A beam of electrons is directed onto a tilted crystalline sample in a SEM.  The electrons interact with the atoms in the crystal lattice and undergo backscatter diffraction.  The electrons' fluorescence on the phosphor screen of a camera is recorded by a CCD.  Sopftware is used to determine a range of information from this diffraction pattern.

Electron Backscatter Diffraction (EBSD)

Phase map identifies sintered titania (blue) and silver (red) nanoparticles. Grain boundaries in particles are marked in black. Image size: 2 x 2 microns

Key Information

Crystal structure
Microstructure
Grain analysis
Pore analysis
Strain identification
Texture analysis

Common Applications

Texture measurement in steel and aluminium sheet
Grain boundary analysis in fatigue and corrosion failure
Grain analysis in microelectronics interconnects
Thin film structure
Metal and alloy recrystallisation
Strain measurement in deformed materials

CEMMNT Benefits