Atomic Force Microscopy
Atomic Force Microscopy (AFM) generates three dimension images and surface property information by scanning a stylus (typical diameter 5 nanometres) over areas of 100 microns and below with Angstrom precision. This non-destructive technique requires no sample preparation and operates in air, fluid, electrochemical and vacuum environments using laser feedback to minimise forces between the tip and sample. Sample temperature can be varied and experiments performed under humidity control. Advanced imaging modes enable a wide range of materials properties to be characterised with nanometre resolution. The probe can also be precisely positioned for local spectroscopic analysis.
Nano Fibres: 5 x 5 micron scan
Key Information
- 3-D Topography imaging
- Imaging under fluid
- Local friction imaging
- Surface potential imaging
- Electrical conductivity imaging
- Magnetic and electric field imaging
- Thermal conductivity mapping
- Temperature mapping
- Modulus mapping
- Nanoindentation to determine stiffness, storage and loss modulus
- Affinity imaging
- Adhesion mapping
- Sample temperature control to 200 Celsius
Common Applications
- Nanoscale roughness measurement from wafers to final devices
- Identification of phases and domains on polymers, coatings and composites
- Measurement of cell, nanoparticle, colloid, and bio molecule adhesion
- Imaging magnetic and electrical characterisation of carbon nanotubes
- Identification of charge leakage and local device defects
CEMMNT Benefits
Industry Sectors
Application Notes