Upgrade to UHV-VT-SPM
The ultra high vacuum (UHV) scanning probe microscope (SPM) purchased via CEMMNT from RHK Technologies has recently been upgraded and will enable variable temperature (VT) measurements. These temperatures range from as low as liquid nitrogen (-100 °C) for thermal stability up to silicon sublimation (1000 ° C) used to ensure ultra clean samples. This combined with the capability of ultra high vacuum (down to 10-9 torr) makes this SPM unique in being commercially available to industry.
Possible applications for this analysis include:
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Nanoscale electrical measurements for organic based devices
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Atomic resolution of crystals
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Monitoring in real time processes (polymer crystallization, biological progesses, etc.
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Scanning Thermal Microscopy for nano composite analysis on the micro / nano scale.
Future upgrades will include capabilities for magnetic fields applied to samples.