As CEMMNT’s measurement and characterisation capabilities comprise a broad cross section of high specification microscopy techniques, CEMMNT attended MICROSCIENCE2008, the major international microscopy conference and exhibition event at London’s ExCeL Centre. With a fully operational Taylor Hobson CCI Optical Profilometry system on it's stand and an open invitation for all attendees to have their samples run, the CEMMNT team profiled materials ranging from a sunflower seed to semiconductor material.

To highlight the depth and breadth of metrology experience within CEMMNT, we also hosted a technical workshop with three CEMMNT technologists providing a cross section of relevant information demonstrating the benefits of access to multiple measurement techniques down to the micro and nano scale.

Dr Allan Pidduck from Advanced Analytics, QinetiQ, gave an illuminating insight into the use of Dynamic Optical Microscopy and Metrology to quantify MEMS devices whilst they are in operation.

Dr Rob Boyd, NPL, used his broad experience of electron microscopy to compare and contrast SEM and TEM technologies for a fuller characterisation of gold nanoparticles.

Taylor Hobson sales representative, Joe Armstrong, provided an overview of this ultra-precision technology company’s portfolio of contact and non-contact measurement solutions within the field of surface and form metrology.

Download the workshop presentations

The event was an excellent opportunity for attendees to meet with the CEMMNT team and understand how our metrology expertise can provide meaningful solutions to their R&D and manufacturing problems, and how our technologists can advise on the measurement of material properties in order to predict and understand a future product or device’s behaviour.

We’ll definitely be back at MicroScience 2010!