To map the gaps in existing metrology capabilities and strategically develop new metrologies to meet the needs of an ever changing market place, CEMMNT co-sponsored a workshop entitled “Metrology and Characterisation for Micro and Nano Technology”. The workshop gathered a diverse group of experts from across Europe with interests in metrology, characterisation and design of MNT based products and systems. 

The successful delivery of competitive products and services is critically dependent on the ability to meet requirements in terms of cost and functionality. The workshop focused therefore on methodologies and processes that the EU must adopt to enable the successful development of components and systems that meet these requirements. The experts identified the priority areas associated with metrology, test and characterisation in the context of functional validation and performance verification.

The workshop was held in May in Loughborough, England, and was jointly sponsored by NEXUS, CEMMNT, IPMKTN (Integrated Products Manufacturing Knowledge Transfer Network), and the SEIC (Systems Engineering Innovation Centre).

Download the Workshop Report