From characterisation of substrates for flexible and flat panel displays to analysis of display pixels themselves, metrology and surface analysis are crucial for technology developments. Our surface profiler technology can analyse large sample substrates with nanometre accuracy. Techniques for determining stress and structural defects can pinpoint causes of failure. 

  

New organic and inorganic display materials can be characterised at the nanoscale using a combination of atomic force and spectroscopic techniques.  Nanoparticles which are integral to the properties of inks can be characterised for size, morphology and chemical composition.