Our 3D metrology tools characterise the performance of optoelectronic devices and their components. Chemical, elemental and depth profiling is used in both R&D and failure analysis. New organic and inorganic display materials can be characterised at the nanoscale using a combination of atomic force and spectroscopic techniques.

 

Metrology is key in device fabrication from characterising quality of wafers and polymer substrates, to multi-layer films, passivation layers and device interconnects. Trace dopants, contaminants and defects can be both identified and characterised.

Utilising the expertise of our industry leading partners, we can drive both new product innovation and characterisation of existing products.