Metrology applications are widespread in the data storage industry. Optical profilometry and AFM characterises CMP finish on hard drive disks. AFM maps magnetic field distributions, identifying defects.

 

On the disk drives themselves, the flatness of the air bearing slider head determines fly height and pole tip recession (PTR) is routinely measured using optical profilometry and AFM. The thickness, morphology and stiffness of diamond like carbon (DLC) head coatings are determined combining visualisation and spectroscopic techniques.

 

Our technology and expertise can additionally accelerate R&D for next generation data storage which utilise novel technologies such as quantum dots, nanoparticles and bio molecules.