Events

Design-for-Purpose Metrology Expert Workshop

Monday, 19th May 2008

Systems Engineering Innovation Centre, Loughborough

A specialist meeting of experts is to be held on the 19th of May 2008 to discuss and debate the topics of metrology and characterisation for micro and nano technologies in the context of “design-for-purpose”.

This is the second in a series of workshops initiated by NEXUS on behalf of the European Commission (IST) to help develop the priorities for research within the ongoing FP7 programme. The workshop will be held at the Systems Engineering Innovation Centre (SEIC) in Loughborough and will be cosponsored by the Centre of Excellence in Metrology for Micro & Nano Technologies (CEMMNT) and Patent-DfMM.

The output of this workshop will be a priority list of research areas and a roadmap to help deliver the required capabilities for Europe’s MNT research, development and commercialisation activities.

If you are interested in being part of this event, please contact henne@enablingmnt.com for participation details.  As an acknowledged world expert in this field your participation will be of most importance and your contributions highly valued.

Contacts

Henne Van Heeren
henne@enablingmnt.com
phone: 0031 654 954 621

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