CEMMNT Metrology Workshop and Surgery
MICROSCIENCE 2008, ExCel London
23rd - 26th June 2008

CEMMNT will be offering a workshop entitled ‘The whole picture: linking microscopy & characterisation techniques’ at MICROSCIENCE 2008, on Tuesday, 24 June 2008, as part of the In Situ TEM and Nano FIB & FAB conference sessions.

In the exhibition area, CEMMNT will have on hand a Taylor Hobson CCI Optical Profiler, with sub-Angstrom resolution, to perform rapid non-contact 3D analyses of delegate samples.  Please come visit us, at Stand E3, to discuss your metrology challenges with our experts.

For more information about MICROSCIENCE 2008, click here.