In a recent workshop held at MICROSCIENCE 2008, leading CEMMNT technologists discussed three important application areas where characterisation on the micro and nanoscale impacts industry. 

 

Joe Armstrong from Ametek Taylor Hobson discussed non contact 3D topography of precision surfaces and highlighted developments in white light interferometry.

(Download of presentation available soon)

 

Dr. Rob Boyd from NPL presented a case study on nanoscale measurement techniques. Focussing on transmission electron microscopy (TEM) and scanning probe microscopy in the measurement of gold nanoparticles, Rob provided a candid look at the differences between these two techniques and the benefits of using multiple analysis methods for full characterisation. Download the case study (at right)  to view the presentation.

 

 

 

 

Dr. Allan Pidduck from QinetiQ highlighted dynamic optical microscopy and metrology of operating MEMS devices.

(Download of presentation available soon)