The “Metrology and Characterisation for micro and nano technology” expert's workshop report highlights general trends relevant for metrology and characterisation and identifies potential challenges on three themes: measurements (where to measure and how), information and knowledge management (what to measure), and interactions, background and infrastructure (how to measure).  Each theme challenge is discussed in detail and includes a long term vision for addressing it.

The report stems from the workshop, held in May in Loughborough England, which gathered a diverse group of experts from across Europe with interests in metrology, characterisation and design of MNT based products and systems.  The workshop focused on methodologies and processes that the EU must adopt to enable the successful development of components and systems that meet requirements. The experts identified the priority areas associated with metrology, test and characterisation in the context of functional validation and performance verification.